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Camera is the control and analysis application for the Leiden Probe Microscopy Scanning Tunneling Microscope (STM) and for the Atomic Force Microscope (AFM). Camera is the acronym for Computer Aided Measurement Environment for Realtime Atomic imaging.

The Principle of Scanning Probe Microscopy introduces you to the various variants of scanning probe microscopy.

STM and AFM are collectively called Scanning Probe Microscopy (SPM).

In 2005 and 2006 I've been working on the library that provides Camera with its image filtering capabilities.

Pushing the limits of SPM: high-speed imaging and imaging under extreme conditions.

From 2007 onwards I'm involved in all aspects of the Camera application.

On 19, 20 and 21 june 2006 I attended the conference Image Analysis for Microscopy 2006 at Liverpool, UK, where I presented some recent results of our work in relation to Camera

More about the research can be found at the Interface Physics group's website.